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Nondestructive Testing of Materials and Structures
by Büyüköztürk, Oral.
Publication:
. XXIX, 1278 p. 776 illus., 370 illus. in color.
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Ellipsometry at the Nanoscale
by Losurdo, Maria.
Publication:
. XXIV, 730 p. 423 illus., 106 illus. in color.
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Fundamentals of Mass Determination
by Borys, Michael.
Publication:
. IX, 114p.
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Optical Measurements, Modeling, and Metrology, Volume 5
by Proulx, Tom.
Publication:
. X, 422 p.
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Thermomechanics and Infra-Red Imaging, Volume 7
by Proulx, Tom.
Publication:
. VIII, 132 p.
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Nanoindentation
by Fischer-Cripps, Anthony C.
Publication:
. XXII, 282 p.
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Springer Handbook of Metrology and Testing
by Czichos, Horst.
Publication:
. 1500p. 500 illus. in color.
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Optical Measurement of Surface Topography
by Leach, Richard.
Publication:
. XIV, 326p. 231 illus., 42 illus. in color.
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New Horizons of Applied Scanning Electron Microscopy
by Shimizu, Kenichi.
Publication:
. XIV, 182p. 102 illus., 25 illus. in color.
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Electroanalytical Methods
by Scholz, Fritz.
Publication:
. XXVII, 359p. 101 illus.
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Modeling Nanoscale Imaging in Electron Microscopy
by Vogt, Thomas.
Publication:
. XV, 265p. 80 illus., 32 illus. in color.
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Mass Metrology
by Gupta, S. V.
Publication:
. XVIII, 354 p.
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Studying Kinetics with Neutrons
by Eckold, Götz.
Publication:
. XVI, 271p. 142 illus.
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Units of Measurement
by Gupta, S. V.
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Evaluating Measurement Accuracy
by Rabinovich, Semyon G.
Publication:
. XVIII, 313 p. 22 illus.
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Computational Electromagnetics and Model-Based Inversion
by Sabbagh, Harold A.
Publication:
. XVII, 448 p. 288 illus., 83 illus. in color.
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Evaluating Measurement Accuracy
by Rabinovich, Semyon G.
Publication:
. XV, 271p. 17 illus.
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